Spectroscopic Ellipsometry & Thin‑Film Consultation
Get results you can trust: thickness, refractive index (n, k), and surface roughness from UV–IR with model fits and clean, reproducible methods. Perfect for R&D, vendor qualification, and production QA.
20+ yrsellipsometry expertise
UV–IRbroad spectral range
Fastturnaround reports
How it works
Simple, focused, measurement‑first engagement.
1) Tell us your question
What do you need to know—thickness, n & k dispersion, roughness, film uniformity, stack verification?
2) Send samples
We measure, model, and validate against your expected materials / dispersion models (Cauchy, Tauc‑Lorentz, etc.).
3) Receive a clear report
Includes fitted parameters, residuals, assumptions, AOI/λ ranges, and raw data for your archives.
Ready to get measured?
Email info@ellipsometrics.com with a short note (materials, substrate, wavelength range, expected thickness). We’ll confirm scope and timeline.
Contact
Email info@ellipsometrics.com